18 April 2011: The PhotoEmission Electron Microscope (PEEM) principally consists of electron optics for performing spatially resolved spectroscopy and topography on samples, manipulated within a ultrahigh vacuum (UHV) environment. Through the PEEM, the Nanoscience beamline is able to resolve nanoparticles with diameters of less than 20nm, using polarized soft x-rays. Photo taken by Max von Seibold.
Posted on Monday April 18th
